SEE: Spherical Embedding Expansion for Improving Deep Metric Learning (Extended Abstract)

SEE: Spherical Embedding Expansion for Improving Deep Metric Learning (Extended Abstract)

Binh M. Le, Simon S. Woo

Proceedings of the Thirty-Fourth International Joint Conference on Artificial Intelligence
Sister Conferences Best Papers. Pages 10906-10911. https://doi.org/10.24963/ijcai.2025/1214

The primary goal of deep metric learning is to construct a comprehensive embedding space that can effectively represent samples originating from both intra- and inter-classes. Although extensive prior work has explored diverse metric functions and innovative training strategies, much of this work relies on default training data. Consequently, the potential variations inherent within this data remain largely unexplored, constraining the model's robustness to unseen images. In this context, we introduce the Spherical Embedding Expansion (SEE ) method. SEE aims to uncover the latent semantic variations in training data. Especially, our method augments the embedding space with synthetic representations based on Max-Mahalanobis distribution (MMD) centers, which maximize the dispersion of these synthetic features without increasing computational costs.We evaluated the efficacy of SEE on four renowned standard benchmarks for the image retrieval task. The results demonstrate that SEE consistently enhances the performance of conventional methods when integrated with them, setting a new benchmark for deep metric learning performance across all settings.
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